Certain non-killer but marginal wafer defects can escape detection if they have sufficient electrical connectivity.

As logic and memory semiconductor devices approach the limits of Moore’s Law, the requirements for accuracy in layer transfer become increasingly stringent. One leading silicon wafer manufacturer ...

After the starting materials are introduced into the manufacturing process there will be a wafer functionalization process where a functional surface combines the properties of the substrate and the ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...

MUNICH, April 22, 2022 /PRNewswire/ -- ERS electronic, the industry leader in the market of thermal management solutions for semiconductor manufacturing, is introducing an extension of the ...