Scanning electron microscopy (SEM) is an advanced analytical tool that massively outstrips the capabilities of traditional light microscopy. Using visible wavelengths of light on the 400 – 700 ...

Critical Dimension Scanning Electron Microscopy (CD-SEM) is a specialized technique used for high-resolution imaging and precise measurement of nanoscale structures in semiconductor manufacturing and ...

The Helios 5 Hydra DualBeam (plasma focused ion beam scanning electron microscope, PFIB-SEM) from Thermo Scientific has the ability to provide four different ion species as the primary beam. This ...

Users can combine the imaging and analysis power of a high-resolution field emission scanning electron microscope (FE-SEM) with the processing capacity of a next-generation focused ion beam microscope ...

Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...

Scanning transmission electron microscopy (STEM) combines the spatial scanning capabilities of SEM with the detection geometries used in TEM to provide information that can be used for detailed local ...

In conventional scanning tunnelling microscopy, so-called electronic states on the sample surface are used for the ...

Electron Source Much like the traditional scanning electron microscope (SEM), the field emission scanning electron microscope uses electrons to illuminate a sample, instead of visible light as is used ...

For the first time, spin waves, also known as magnons, have been directly observed at the nanoscale. This breakthrough was ...

According to [Asianometry], no one believed in the scanning electron microscope. No one, that is, except [Charles Oatley].The video below tells the whole story. The Cambridge graduate built radios … ...