Teledyne DALSA has announced the launch of its new Tetra line scan camera family, designed for various machine vision applications. The Tetra series incorporates advanced multiline CMOS image sensor ...

The new Tetra line scan camera family leverages Teledyne’s latest multi-line CMOS image sensor technology and builds on the success of the original Linea series of high-value line scan cameras. The ...

WATERLOO, Ontario, April 05, 2022 (GLOBE NEWSWIRE) -- Teledyne DALSA, a Teledyne Technologies [NYSE:TDY] company, is pleased to announce the release of its multispectral Camera Link HS (CLHS) line ...

Emergent Vision Technologies, a maker of high-speed GigE Vision cameras and vision technologies, introduces a new 100GigE line scan camera, the Pinnacle LZ-16KG5. Through its 100GigE QSFP28 interface, ...

The Pinnacle LZ 16KG5 100GigE line scan camera reaches a top single line rate of 400KHz and a trilinear rate of 133KHz. It is available in monochrome and color versions and features a 16Kx16Gpixel ...

New Imaging Technologies (NIT) introduces the LiSaSWIR 2048 v2, a next-generation SWIR line-scan camera designed for high-speed, high-precision inspection applications. Powered by NIT’s new NSC2301 ...

Emergent Vision Technologies, a maker of high-speed GigE Vision cameras and zero-data-loss vision technologies, introduces a new 10GigE line scan camera, the PACE LR-4KG35. Through its 10GigE SFP+ ...

Konstanz, Germany -- Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable ...

A line scan camera from Teledyne Dalsa provides spectrally independent RGB and NIR outputs to detect defects on and under the surface. The Linea ML 8k multispectral camera can be used for examining a ...

France’s New Imaging Technologies has launched a short-wave infrared line-by-line scanning camera for high-definition and high-performance silicon PV inspection systems. New Imaging Technologies (NIT) ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...