Research from all publishers Recent studies have advanced methodologies to enhance the detection and characterisation of delay defects in integrated circuits. In 2024, researchers introduced a ...

Let’s step back in time a few decades to 1983, with an interesting tour of the IC manufacturing facility at Bell Labs at Murray Hill (video, embedded below) and you can get a bit more of an idea ...

Breakthrough in laser-chip integration could streamline photonic chip manufacturing and unlock scalable data center ...

A team of researchers affiliated with UNIST has successfully integrated artificial intelligence (AI) technology into the manufacturing process of lithium-ion battery cathode precursors, reducing ...

A project at MIT has developed a process to integrate atomic-scale defects located in thin slices of diamond, so called "artificial atoms," into photonic circuitry on a larger scale than previously ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...