MUNICH--(BUSINESS WIRE)--Cadence Design Systems, Inc. (NASDAQ: CDNS) today introduced the Cadence ® Legato™ Reliability Solution, the industry’s first software product that meets the challenges of ...

Chip reliability is coming under much tighter scrutiny as IC-driven systems take on increasingly critical and complex roles. So whether it’s a stray alpha particle that flips a memory bit, or some ...

Experts at the Table: Semiconductor Engineering sat down to talk about silicon lifecycle management, how it’s expanding and changing, and where the problems are, with Prashant Goteti, principal ...

Yokogawa Electric Corp. has developed a flat panel display (FPD) driver IC test system that supports high-speed interfaces. The ST6731, which will be available in March 2011, that supports interfaces ...

As IC electronics have become more densely packed, cross-talk among them has become a problem As IC electronics have become more densely packed, cross-talk among them has become a problem. One means ...

Power Integrations’ 1700 V Switcher IC Delivers Reliability and Space-Saving Benefits in 800 V BEVs Performance of InnoSwitch™3-AQ flyback IC demonstrated in new reference designs featuring ...

STAr Technologies, a leader in parametric and reliability test systems today has launched STAr Pluto series tester to meet test needs for both Package- and Wafer-level reliability test systems. This ...

Reliability tests are a crucial part of the manufacturing process, one that ensures your product meets the quality standards your customers expect. All the same, designing good reliability tests is ...

Hi folk, I’ve been in hunkered down mode for the last few weeks researching and writing my next cover story. This one’s on IC reliability. It’s a subject I haven’t tackled before and quite frankly is ...

Performance of InnoSwitch™3-AQ flyback IC demonstrated in new reference designs featuring wide-creepage package The InnoSwitch3-AQ IC, featuring a 1700 V silicon-carbide (SiC) switch, is an ideal ...