Support grids are a key part of electron microscopy measurements; the choice of the grid can directly influence the quality and accuracy of the final image. This is particularly true for transmission ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

Single-particle analysis is increasingly important for structural studies of molecular machines and macromolecular assemblies. It is based on the acquisition of large datasets of transmission electron ...